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Dynamic speckle inspection with raw data compression
Author(s): Elena Stoykova; Branimir Ivanov; Kwan-Jung Oh; Joongki Park
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Paper Abstract

Dynamic speckle analysis is an effective approach for industrial inspection of speed of processes. The relevant information is retrieved by statistical processing of temporal sequences of speckle patterns formed on the surface of diffusely reflecting objects under laser illumination. The measurement output is a 2D activity map, which shows regions of higher or lower activity in the object. Following a process in time requires a great number of images, in which the recorded values of intensity are of minor importance. In view of the dynamic speckle measurement specifics, we propose in the paper coarser quantization of the raw speckle data as an approach for data compression. Its efficacy is proved by processing numerical and experimental speckle patterns. Decreasing the number of the quantization levels down to 32 causes no distortions in the activity map. Further decrease of the quantization level number is applicable only to data acquired at uniform illumination and equal reflectivity across the object surface.

Paper Details

Date Published: 21 June 2019
PDF: 8 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110562E (21 June 2019); doi: 10.1117/12.2526035
Show Author Affiliations
Elena Stoykova, Institute of Optical Materials and Technologies (Bulgaria)
Branimir Ivanov, Institute of Optical Materials and Technologies (Bulgaria)
Kwan-Jung Oh, Electronics and Telecommunications Research Institute (Korea, Republic of)
Joongki Park, Electronics and Telecommunications Research Institute (Korea, Republic of)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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