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Non-destructive and real-time optical inspection for lens size using swept source optical coherence tomography
Author(s): Pingping Jia; Hong Zhao II; Jinlei Zhao III; Meiqi Fang IV; Yuwei Qin V
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Paper Abstract

The SS-OCT system was constructed using a swept laser source and a compact Michelson interferometer. The outputs of sweep source include laser signal and k-trigger signal. The laser signal realizes spectral interference and the k-trigger signal realizes acquisition interferometer signal with uniformly wavenumber interval. However, there are two problems. The first one is that the output wavenumber of the source changes non-linear with time. To solve this problem, a wavenumber phase equalization algorithm is proposed. The second problem is that the unfixed delay between the spectral calibration signal k-trigger and the OCT signal, which makes the result of spectral calibration incorrectly. Aiming at the asynchronization between the acquire OCT signal and the k-trigger signal, an algorithm of k-clock delay correction based on cross correlation is adopted to correct the delay. The SS-OCT system could be used for accurate measurement the curvature of the laser focusing lens due to its excellent advantages such as non-destructive, high resolution and high inspection speed. The 2D tomography maps of a laser focusing lens are measured by this system and real-time images are obtained.

Paper Details

Date Published: 21 June 2019
PDF: 6 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110562C (21 June 2019); doi: 10.1117/12.2525974
Show Author Affiliations
Pingping Jia, Xi'an Jiaotong Univ. (China)
Weinan Normal Univ. (China)
Hong Zhao II, Xi'an Jiaotong Univ. (China)
Jinlei Zhao III, No.203 Research Institute of China Ordnance Industries (China)
Meiqi Fang IV, Xi'an Jiaotong Univ. (China)
Yuwei Qin V, Weinan Normal Univ. (China)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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