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Inspection of surface imperfections via height contrast imaging based on angle selective illumination
Author(s): T. Milde; C. Knechtel
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Paper Abstract

Surface inspection of non-transparent objects is a common task in the field of industrial quality control. For specular reflective surfaces, deflectometry methods can be used. For diffuse reflecting surfaces, the back reflected light has the shape of a cone due to diffuse scattering. This work describes, how the ideas from digital phase reconstruction microscopy can be modified to obtain height profiles of such object surfaces. The approach is evaluated with textile samples and the task to determine their degree of pilling after a specific preparation procedure. The method is applied in further cases of objects which suffer from some reflections or shadows and the results of this attempt are provided as well.

Paper Details

Date Published: 21 June 2019
PDF: 11 pages
Proc. SPIE 11062, Digital Optical Technologies 2019, 110620Z (21 June 2019); doi: 10.1117/12.2525958
Show Author Affiliations
T. Milde, Carl Zeiss AG (Germany)
C. Knechtel, Carl Zeiss SMT GmbH (Germany)


Published in SPIE Proceedings Vol. 11062:
Digital Optical Technologies 2019
Bernard C. Kress; Peter Schelkens, Editor(s)

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