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Light-sample interaction in microsphere enhanced 2D super-resolution imaging
Author(s): Göran Maconi; Ivan Kassamakov; T. Vainikka; Timo Arstila; Edward Hæggström
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Paper Abstract

We simulate the image generated by a microsphere residing in contact on top of an exposed Blu-ray disk surface, when observed by a conventional microscope objective. While microsphere lenses have been used to focus light beyond the diffraction limit and to produce super-resolution images, the nature of the light-sample interaction is still under debate. Simulations in related articles predict the characteristics of the photonic nanojet (PNJ) formed by the microsphere, but so far, no data has been published on the image formation in the far-field. For our simulations, we use the open source package Angora and the commercial software RSoft FullWave. Both packages implement the Finite Difference Time Domain (FDTD) approach. Angora permits us to accurately simulate microscope imaging at the diffraction limit. The RSoft FullWave is able to record the steady-state complex electrical and magnetic fields for multiple wavelengths inside the simulation domain. A microsphere is simulated residing on top of a dielectric substrate featuring sub-wavelength surface features. The scattered light is recorded at the edges of the simulation domain and is then used in the near-field to far-field transformation. The light in the far field is then refocused using an idealized objective model, to give us the simulated microscope image. Comparisons between the simulated image and experimentally acquired microscope images verify the accuracy of our model, whereas the simulation data predicts the interaction between the PNJ and the imaged sample. This allows us to isolate and quantify the near-field patterns of light that enable super-resolution imaging, which is important when developing new micro-optical focusing structures.

Paper Details

Date Published: 21 June 2019
PDF: 7 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110560Q (21 June 2019); doi: 10.1117/12.2525489
Show Author Affiliations
Göran Maconi, Univ. of Helsinki (Finland)
Ivan Kassamakov, Univ. of Helsinki (Finland)
Nanojet Inc. (Finland)
T. Vainikka, Nanojet Inc. (Finland)
Timo Arstila, Nanojet Inc. (Finland)
Edward Hæggström, Univ. of Helsinki (Finland)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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