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Analysis of electron-photon interaction processes, exciting a polariton field, and the choice of an effective metal-dielectric structure to maintain this effect
Author(s): Aydar I. Salikhov; Albert Kh. Sultanov ; Irina L. Vinogradova; Vladimir P. Zhitnikov ; Renat B. Salihov; Denis M. Fatkhiev ; Vitaliya D. Bagaeva
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Paper Abstract

This article devoted to an analytical review and detailed analysis of the current state in the field of a formalized description of the physical processes of excitation of the polariton field. The processes of resonant electron-photon interaction in various metal-dielectric structures (including planar) are studied. An approach to modeling the properties of contacting materials leading to the appearance of a surface polariton field has been developed. The process of obtaining the radio frequency spectra of the polariton field is analyzed. A detailed review of metal-dielectric structures and schemes suitable for use in plasmon structures has been performed. The recommended structures for obtaining the radio frequency spectra (of the millimeter and submillimeter ranges) of the plasmon field are determined.

Paper Details

Date Published: 24 June 2019
PDF: 15 pages
Proc. SPIE 11146, Optical Technologies for Telecommunications 2018, 111460G (24 June 2019); doi: 10.1117/12.2525469
Show Author Affiliations
Aydar I. Salikhov, Ufa State Aviation Technical Univ. (Russian Federation)
Albert Kh. Sultanov , Ufa State Aviation Technical Univ. (Russian Federation)
Irina L. Vinogradova, Ufa State Aviation Technical Univ. (Russian Federation)
Vladimir P. Zhitnikov , Ufa State Aviation Technical Univ. (Russian Federation)
Renat B. Salihov, Bashkir State Univ. (Russian Federation)
Denis M. Fatkhiev , Ufa State Aviation Technical Univ. (Russian Federation)
Vitaliya D. Bagaeva , Ufa State Aviation Technical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11146:
Optical Technologies for Telecommunications 2018
Vladimir A. Andreev; Anton V. Bourdine; Vladimir A. Burdin; Oleg G. Morozov; Albert H. Sultanov, Editor(s)

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