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Sampling strategy and product validation over nonuniform surface-based on TEM and CGM upscaling: A case study on LAI
Author(s): Xiaohua Zhu; Lingling Ma; Chuanrong Li; Lingli Tang; Yongguang Zhao; Huijing Zhang
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Paper Abstract

Aimed at remote sensing product validation, such as leaf area index (LAI), a new sampling strategy based on Taylor expansion method (TEM) and computational geometry model (CGM) is proposed in this paper. Firstly, a correlation index (CI) is calculated based on TEM using high-resolution LAI image to choose the field points of in-situ reference data. Secondly, based on the selected field measurements, the CGM model is established for simulating low-resolution LAI image. Thirdly, the points of in-situ reference data are decided according to the gaps between the simulated LAI and the aggregated LAI from high resolution. If the gap is accepted, the sampling strategy is finally established for field measurement. Otherwise, the field measurements should be re-selected and analyzed until the gap is accepted. Finally, the new sampling strategy is analyzed and compared with traditional sampling strategies, and the results indicate that the sampling strategy proposed in this paper is more stable and efficient.

Paper Details

Date Published: 30 April 2019
PDF: 6 pages
Proc. SPIE 11026, Nonlinear Optics and Applications XI, 110261I (30 April 2019); doi: 10.1117/12.2525310
Show Author Affiliations
Xiaohua Zhu, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)
Lingling Ma, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)
Chuanrong Li, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)
Lingli Tang, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)
Yongguang Zhao, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)
Huijing Zhang, Key Lab. of Quantitative Remote Sensing Information Technology (China)
Aerospace Information Research Institute (China)


Published in SPIE Proceedings Vol. 11026:
Nonlinear Optics and Applications XI
Mario Bertolotti; Alexei M. Zheltikov, Editor(s)

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