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Removal of monotonically increasing or decreasing phase ambiguity in retrieved phase by Riesz transform method in digital interferometric techniques
Author(s): Yassine Tounsi; Manoj Kumar; Abdelkrim Nassim; Fernando Mendoza-Santoyo
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Paper Abstract

In this work, a method based on vortex operator, for removal of monotonically increasing or decreasing phase ambiguity in the retrieved phase by the Riesz transform method in digital interferometric techniques is presented. Since in digital interferometric techniques, the phase extraction methods and algorithms are essential because these techniques are being continuously employed in many scientific, industrial, and engineering applications to measure various physical parameters which are encoded as the phase of the fringe pattern. There exist many methods/algorithms for phase extraction from the fringe pattern such as temporal phase-shifting, spatial phase-shifting, fast Fourier transforms (FFT) method, wavelet transform, Hilbert transform etc. In recent years, phase extraction from a single fringe pattern by using the Riesz transform method is developed because of its several advantages. However, the retrieved phase by Riesz transform is affected by π shifts due to the lack of discrimination between positive and negative spatial frequencies. This problem could be resolved by using a vortex operator which filters the data in the frequency domain. We present here some simulated results demonstrating the removal of phase ambiguity in the retrieved phase by Riesz transform method.

Paper Details

Date Published: 21 June 2019
PDF: 6 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 1105638 (21 June 2019); doi: 10.1117/12.2525078
Show Author Affiliations
Yassine Tounsi, Univ. Chouaïb Doukkali (Morocco)
Manoj Kumar, Kobe Univ. (Japan)
Abdelkrim Nassim, Univ. Chouaïb Doukkali (Morocco)
Fernando Mendoza-Santoyo, Ctr. de Investigaciones en Óptica, A.C. (Mexico)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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