Share Email Print
cover

Proceedings Paper • new

AbloCAM: a versatile optomechanical, semi-automated tool for an in situ characterization and optimization of focused XUV/x-ray laser beam (Conference Presentation)
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For quick, efficient and accurate alignment and characterization of focused short-wavelength (i.e., extreme ultraviolet, soft x-ray, and x-ray) laser beams directly in the vacuum interaction chambers, an instrument has to be developed and implemented. AbloCAM should represent such a handy tool looking at ablation imprints of the beam in a suitable material without breaking vacuum and need for a liberation of exposed samples from the chamber to analyse them ex situ. First steps we made in this direction can be found in ref. [1] The technique of the fluence scan (F-scan method; for details see [2,3]), proven at several FEL facilities, e.g., FLASH (Free-electron LASer in Hamburg) and LCLS (Linac Coherent Light Source), makes possible to characterize the beam utilizing just an outer contour of the damage pattern. It is not necessary to measure a crater profile for the beam reconstruction. Not only lateral, but also a longitudinal distribution of irradiance can be determined in the focused beam by its imprinting (z-scan method [4]). Technically, the AbloCAM tool consists of a vacuum compatible motorized positioning system executing a series of well-defined irradiations of a chosen slab target according to algorithms fulfilling requirements of the combined F(z)-scan procedure. Damage patterns formed in that way should then be visualized in situ by means of Nomarski (DIC – Differential Interference Contrast) microscope equipped with the software which indicates and processes pattern outer contours. There is a feedback established between positioning and inspecting components and functions of the tool. The software helps to align and characterize any focused beam in the interaction chamber semi-automatically in a reasonable time.

Paper Details

Date Published: 14 May 2019
PDF
Proc. SPIE 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII, 1103506 (14 May 2019); doi: 10.1117/12.2524883
Show Author Affiliations
Katerina Juránová, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Czech Technical Univ. in Prague (Czech Republic)
Tomáš Burian, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Vera Hájková, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Jan Hošek, Czech Technical Univ. in Prague (Czech Republic)
Libor Juha, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Jan Kybic, Czech Technical Univ. in Prague (Czech Republic)
Šárka Nemcová, Czech Technical Univ. in Prague (Czech Republic)
Bohdan Petryshak, Czech Technical Univ. in Prague (Czech Republic)
Vojtech Vozda, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Ludek Vyšín, Institute of Physics of the CAS, v.v.i. (Czech Republic)
Jaromír Chalupský, Institute of Physics of the CAS, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 11035:
Optics Damage and Materials Processing by EUV/X-ray Radiation VII
Libor Juha; Saša Bajt; Stéphane Guizard, Editor(s)

© SPIE. Terms of Use
Back to Top