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Influence of void inside bonding layer on laser damage threshold of high reflective coating of thin disk laser
Author(s): Mu Wang; Guangzhi Zhu; Yongqian Chen; Yuanhao Zhang; Aleksei Kozlov; Xiao Zhu
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Paper Abstract

With thin disk laser under intensive pumping high heat flux go through the bonding area with voids inside it will introduce local temperature and stress increase in high-reflective(HR) coating above bonding layer. This will influence the laser damage threshold(LDTH) of local HR coating. An analytical model is developed to analyze the HR coating of thin disk laser illuminated by high fluence pulse laser considering crystal pumping and void inside bonding layer. Analytical results show that the area of HR coating is stressed and heated under crystal pumping. When illuminated by high fluence pulse laser the coating at this area has higher thermal stress. With pump density of 5kW/cm2 if the radius of the void is larger than 100um the LDTH of HR coating will be affected by the void significantly. And the larger the void size is the lower the LDTH of HR coating is. Relative lower laser damage threshold of HR coating above bonding void is testified by experiment.

Paper Details

Date Published: 10 May 2019
PDF: 8 pages
Proc. SPIE 11068, Second Symposium on Novel Technology of X-Ray Imaging, 110682B (10 May 2019); doi: 10.1117/12.2524695
Show Author Affiliations
Mu Wang, Huazhong Univ. of Science and Technology (China)
National Engineering Research Ctr. for Laser Processing (China)
Guangzhi Zhu, Huazhong Univ. of Science and Technology (China)
National Engineering Research Ctr. for Laser Processing (China)
Yongqian Chen, Huazhong Univ. of Science and Technology (China)
National Engineering Research Ctr. for Laser Processing (China)
Yuanhao Zhang, Huazhong Univ. of Science and Technology (China)
National Engineering Research Ctr. for Laser Processing (China)
Aleksei Kozlov, JSC "Research Institute" POLYUS "them. M.F. Stelmaha" (Russian Federation)
Xiao Zhu, Huazhong Univ. of Science and Technology (China)
National Engineering Research Ctr. for Laser Processing (China)


Published in SPIE Proceedings Vol. 11068:
Second Symposium on Novel Technology of X-Ray Imaging
Yangchao Tian; Tiqiao Xiao; Peng Liu, Editor(s)

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