Share Email Print
cover

Proceedings Paper • new

Experimental study on the influence of backward ASE on SBS process in single-frequency amplifier
Author(s): Xuewen Li; Zhao Quan; Hui Shen; Qiurui Li; Yunfeng Qi; Bing He
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have constructed an all-fiber single-frequency amplifier system and an additional all-fiber amplified spontaneous emission (ASE) source system to simulate the effect of generated backward ASE on stimulated Brillouin scattering (SBS) in master oscillator power amplification (MOPA) system. By injecting the artificial ASE source backward into the Yb-doped MOPA system directly and measuring the evolutions of SBS threshold power with the increasing ASE power level, we can get the changes of SBS process during the amplification. Effects of counterpropagating ASE on SBS threshold decreasing were obvious: When there was no counter-propagating ASE being injected, the backscattered power started to rise very slowly. However, with the added artificial ASE increasing, the backscattered power departed from linear quite early. And the SBS threshold power was reduced to different levels with different power level of additional ASE. As the artificial counter-propagating ASE power increased from 0 to 275.9mW, the SBS threshold power was correspondingly dropped down from 4.75W to 3.35W. The 30% reduction of the SBS threshold can be a siginificant influence in a single-frequency fiber amplifier.

Paper Details

Date Published: 29 March 2019
PDF: 5 pages
Proc. SPIE 11046, Fifth International Symposium on Laser Interaction with Matter, 110460E (29 March 2019); doi: 10.1117/12.2524407
Show Author Affiliations
Xuewen Li, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Zhao Quan, Shanghai Institute of Optics and Fine Mechanics (China)
Hui Shen, Shanghai Institute of Optics and Fine Mechanics (China)
Qiurui Li, Shanghai Institute of Optics and Fine Mechanics (China)
Yunfeng Qi, Shanghai Institute of Optics and Fine Mechanics (China)
Bing He, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 11046:
Fifth International Symposium on Laser Interaction with Matter
YiJun Zhao, Editor(s)

© SPIE. Terms of Use
Back to Top