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Numerical simulation of dazzling effects on CCD induced by a 532nm pulsed laser
Author(s): Can Luo; Zewen Li; Zhonghua Shen; Jianmin Zhang
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Paper Abstract

The CCD is widely used to detect laser signal in many industrial vision and automation systems. When the charge coupled device(CCD) is irradiated by intense laser, the image quality may decrease and reversible dazzling effects occur such as single pixel saturation, crosstalk, and full saturation. Understanding the laser dazzling phenomena, on the one hand, it can help to choose the suitable laser sources for the measuring systems, on the other hand, it can optimize the designs of the CCD structures. In order to effectively utilize the dazzling effects, the laser saturation threshold of the CCD must be known. Due to the different internal structure and working mode of CCD, the corresponding laser saturation threshold is also different. In this paper, the dazzling effects on the array CCD induced by a 532nm wavelength pulsed laser is investigated by finite element method. A physical model is established base on drift-diffusion equation according to the working process of CCD and the principle of laser dazzling effects. The working state of CCD under different laser power, charge density, electron concentration and potential curve are presented. This model is found to be useful for the analysis of laser saturation threshold.

Paper Details

Date Published: 29 March 2019
PDF: 14 pages
Proc. SPIE 11046, Fifth International Symposium on Laser Interaction with Matter, 110460X (29 March 2019); doi: 10.1117/12.2524353
Show Author Affiliations
Can Luo, Nanjing Univ. of Science and Technology (China)
Zewen Li, Nanjing Univ. of Science and Technology (China)
Zhonghua Shen, Nanjing Univ. of Science and Technology (China)
Jianmin Zhang, Northwest Institute of Nuclear Technology (China)


Published in SPIE Proceedings Vol. 11046:
Fifth International Symposium on Laser Interaction with Matter
YiJun Zhao, Editor(s)

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