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Robust real-time contact-point detecting and tracking by a horizontal-vertical enhancement method
Author(s): Zhen Huang; Yiquan Liang; Zhenghua Huang; Yaozong Zhang; Tianxu Zhang
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Paper Abstract

The pantograph-catenary interaction is a safety indicator of electric multiple unit (EMU) trains. It is important for EMU trains to monitor the contact-point of pantograph and catenary in real time. In this paper, a highly efficient contactpoint- tracking approach, called horizontal-vertical enhancement and tracking method (HEATM), is proposed to enhance infrared images which are used to detect and track contact-point. The HEATM includes the following three key components. Firstly, the HEATM separates the input infrared image into the horizontal images (HIs) layer and vertical images (VIs) layer. Secondly, the contact-wire tracking model is updated by the points from HIs while the pantographtracking model is updated by the points from VIs. Finally, the key contact-points are positioned by the tracking model and continuously analyzed to obtain robust tracking signals. The quantitative and qualitative results validate the effectiveness of the proposed scheme. Moreover, our method presents very robust and efficient for contact-point detecting and tracking at a speed of 70 fps and 97.8% average accuracy in two datasets (12000 frames), which is very beneficial for its extensive application.

Paper Details

Date Published: 6 May 2019
PDF: 11 pages
Proc. SPIE 11069, Tenth International Conference on Graphics and Image Processing (ICGIP 2018), 1106944 (6 May 2019); doi: 10.1117/12.2524198
Show Author Affiliations
Zhen Huang, Huazhong Univ. of Science and Technology (China)
Yiquan Liang, Huazhong Univ. of Science and Technology (China)
Zhenghua Huang, Wuhan Institute of Technology (China)
Yaozong Zhang, Wuhan Institute of Technology (China)
Tianxu Zhang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 11069:
Tenth International Conference on Graphics and Image Processing (ICGIP 2018)
Chunming Li; Hui Yu; Zhigeng Pan; Yifei Pu, Editor(s)

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