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Spatial characterization of FLASH2 pulses: current status and future plan (Conference Presentation)
Author(s): Masoud Mehrjoo; Elke Plönjes; Barbara Keitel; Marion Kuhlmann; Mabel Ruiz-Lopez; Thomas Wodzinski; Klaus Giewekemeyer; Patrik Vagovic; Yoonhee Kim; Mohammadreza Banjafar; Marc Messerschmidt; Tomáš Burian
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Paper Abstract

The free-electron laser FLASH2, a variable gap undulators line, has opened new scientific possibilities for users at DESY in the Hamburg area [1]. The current pulsed radiation at the FLASH facility primarily relies on the SASE process. Thus, the beam characteristics may differ drastically from pulse to pulse; requiring single-shot photon diagnostics and characterization of the photon beam parameters. The beamline FL24 at FLASH2 is equipped with a set of bendable Kirkpatrick-Baez (KB) mirrors which can strongly focus the beam down to a few micrometers. As a key parameter for many experiments, understanding of the focus characteristics and variations is demanded by users. The current instrumentation at the beamline FL24 has foreseen a dedicated Hartmann-Wavefront Sensor (HWS) to run the online, highly focused, single-shot beam characterization within the operating wavelength range of the FLASH2 [2]. However, a critical issue linked to the success of the current HWS is the assumption of high transverse coherence of the radiation. We observed a slight difference between the retrieved focuses by the HWS and those measured with the imprints method. We attribute the observed difference to the low-degree of the transverse coherence. Recently, we performed a non-destructive Young’s double-pinhole experiment, at the beamline FL24, which proved the variation of the degree of transverse coherence (25-50% deviation from the full coherence) correlated to the various machine parameters [3]. Advances in the Fresnel Diffractive Imaging (FDI) have promoted the FEL pulse characterization by reconstructing partially coherent wave fields. This approach was successfully applied to characterize highly transverse coherent, focused pulses at the beamline BL2 at the FLASH1 line [4]. We have extended the application of the FDI method, at the beamline FL24, to characterize the transverse partially coherent pulses, in a single-shot basis, and estimate a measure of the degree of the transverse coherence. Summarily, we report on the results of our previous pulse and transverse coherence characterization experiments, and discuss the feasibility of each method as an on-line photon diagnostic. Furthermore, our future plan to apply the partially coherent ptychography method [5] for the wave field characterization will be discussed providing the results of start-to-end simulations.---------------------------------------- References and links: 1. B. Faatz, et al. “The FLASH Facility: Advanced Options for FLASH2 and Future Perspectives," Applied Science 7, (2017). 2. B. Keitel, et al. “Hartmann wavefront sensors and their application at FLASH," Special Issue (PhotonDiag2015), J. Synchrotron Rad. 23, (2016). 3. T. Wodzinski, et al. “Coherence measurements with double pinholes at FLASH2," PhotonDiag 2018, Hamburg, Germany. 4. M. Mehrjoo, et al, “Single-Shot Determination of Focused FEL Wave Fields using Iterative Phase Retrieval," Opt. Express,25, (2017). 5. N. Burdet. et al, “Evaluation of partial coherence correction in X-ray ptychography ," Opt. Express, 5, (2015).

Paper Details

Date Published: 14 May 2019
Proc. SPIE 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V, 110380N (14 May 2019); doi: 10.1117/12.2523254
Show Author Affiliations
Masoud Mehrjoo, Deutsches Elektronen-Synchrotron (Germany)
Elke Plönjes, Deutsches Elektronen-Synchrotron (Germany)
Barbara Keitel, Deutsches Elektronen-Synchrotron (Germany)
Marion Kuhlmann, Deutsches Elektronen-Synchrotron (Germany)
Mabel Ruiz-Lopez, Deutsches Elektronen-Synchrotron (Germany)
Thomas Wodzinski, Instituto de Plasmas e Fusão Nuclear (Portugal)
Klaus Giewekemeyer, European XFEL GmbH (Germany)
Patrik Vagovic, European XFEL GmbH (Germany)
Yoonhee Kim, European XFEL GmbH (Germany)
Mohammadreza Banjafar, European XFEL GmbH (Germany)
Marc Messerschmidt, National Science Foundation BioXFEL Science and Technology Ctr. (United States)
Tomáš Burian, Institute of Physics of the CAS, v.v.i. (Czech Republic)

Published in SPIE Proceedings Vol. 11038:
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
Thomas Tschentscher; Luc Patthey; Kai Tiedtke; Marco Zangrando, Editor(s)

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