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Status of the FERMI free-electron laser and contamination/damage of (optical) elements along the photon transport system and in the endstations (Conference Presentation)
Author(s): Marco Zangrando
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Paper Abstract

The FERMI free electron laser at Elettra (Trieste - Italy) has reached its goal configuration in terms of machine and beamlines. In particular, both the FEL lines are routinely employed by users for their experiments, which can now be performed on all the foreseen endstations in the experimental hall. In this contribution the current performance of the machine will be presented including preliminary results from new schemes tested in the last months. Moreover, the final layout and performance of the photon beamlines now operative will be discussed, with particular attention to the optical solutions used and the diagnostics employed. A particular attention, moreover, will be devoted to contamination and damage issues on the different optical elements of the photon transport system (PADReS). This system has been operating since 2011 and is now endowed with more than 80 different optical elements including mirrors (plane, toroidal and ellipsoidal), gratings (Variable Line Spacing planes) and multilayers. Different levels of contamination can occur on them, and strategies on avoiding it as well as cleaning procedures will be discussed. At the same time, true damage of optical surfaces can happen and an example will be reported. Along PADReS, moreover, more than 60 solid state filters are employed to cut unwanted radiation, and also in this case the ways to cope with and remove contamination will be reported. Finally, the use of indentation and other techniques to compare spot size will be reported and discussed together with examples of damage issues related to samples in the endstations.

Paper Details

Date Published: 14 May 2019
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Proc. SPIE 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII, 1103503 (14 May 2019); doi: 10.1117/12.2523179
Show Author Affiliations
Marco Zangrando, Elettra Sincrotrone Trieste S C p A (Italy)
IOM-CNR (Italy)


Published in SPIE Proceedings Vol. 11035:
Optics Damage and Materials Processing by EUV/X-ray Radiation VII
Libor Juha; Saša Bajt; Stéphane Guizard, Editor(s)

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