Share Email Print
cover

Proceedings Paper • new

Sparse aperture masking technique on measurement of star diameter
Author(s): Yanqiang Wang; Chunmin Zhang; Yifan He
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Sparse aperture masking technique is based on principle of optical interference, it has high spatial resolution and is especially suitable for star diameter detection. It transforms telescope into a Fizeau interferometer by a simple action of placing an aperture mask over the pupil plane. In this paper, we explain its principle, simulate whole process on computer and develop our data processing method. Finally, we design a simple optical system in laboratory for experimental verification, in which stellar source is reproduced by a pinhole illuminated by a laser, choosing four sub-aperture mask on pupil plane, by measurement of interferogram visibility, we successfully acquire star diameter.

Paper Details

Date Published: 24 January 2019
PDF: 6 pages
Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 110521I (24 January 2019); doi: 10.1117/12.2522451
Show Author Affiliations
Yanqiang Wang, Xi’an Jiaotong Univ. (China)
Chunmin Zhang, Xi’an Jiaotong Univ. (China)
Yifan He, Xi’an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 11052:
Third International Conference on Photonics and Optical Engineering
Ailing Tian, Editor(s)

© SPIE. Terms of Use
Back to Top