Share Email Print
cover

Proceedings Paper • new

Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)
Author(s): S. J. Ben Yoo
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.

Paper Details

Date Published: 14 May 2019
PDF
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109800O (14 May 2019); doi: 10.1117/12.2522152
Show Author Affiliations
S. J. Ben Yoo, Univ. of California, Davis (United States)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

© SPIE. Terms of Use
Back to Top