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Temperature sensitivity of the focal plane of thermal infrared splitting window band
Author(s): Yanhua Zhao; Hao Wang; Libing Jin; Yan Li; Haijie Dong
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Paper Abstract

It is widely used to correct the atmospheric and surface emissivity by using the split window algorithm to eliminate the atmospheric influence through the combination of the measured values of two adjacent channels (10.3-12.5 m) In the thermal infrared remote sensing inversion of surface temperature. With the increasing demand for split-window spectral data, the development of space optical remote sensors with these two spectral bands has gradually increased in recent years. High-resolution 5 full-spectrum spectral imager is a typical example. Its spatial resolution of thermal infrared split-window spectral band reaches 40m, which is an international advanced level. A large number of studies have shown that the thermal infrared splitting window is very sensitive to the focal plane temperature. With the change of the focal plane temperature, the imager output digital signal varies greatly. For example, when the focal plane temperature changes 0.1K, the 10.3-11.4m spectral band changes 0.02V (equivalent to 13.6DN), 11.5-12.5m spectral band changes 0.006V (equivalent to 4.08DN), so the temperature of FPA must be corrected or controlled strictly.

Paper Details

Date Published: 12 March 2019
PDF: 8 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102338 (12 March 2019); doi: 10.1117/12.2521956
Show Author Affiliations
Yanhua Zhao, Beijing Institute of Space Mechanics and Electricity (China)
Hao Wang, Beijing Institute of Space Mechanics and Electricity (China)
Libing Jin, Beijing Institute of Space Mechanics and Electricity (China)
Yan Li, Beijing Institute of Space Mechanics and Electricity (China)
Haijie Dong, North China Institute of Photoelectric Technology (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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