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Progress and prospectives on engineering application of hyperspectral remote sensing for geology and mineral resources
Author(s): Xinfeng Dong; Bokun Yan; Fuping Gan; Na Li
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Paper Abstract

Remote sensing technology plays an important role in geological survey and plays an irreplaceable role. With the development of remote sensing technology, the appearance of hyperspectral remote sensing makes the application of remote sensing in geological and mineral fields have undergone a qualitative change. After nearly ten years of exploration and practice, the engineering application of hyperspectral remote sensing in geology and mineral resources has been preliminarily realized. With the launch of domestic hyperspectral satellites, it will further promote its application in geology and mineral resources. In this paper, the progress of engineering application of hyperspectral remote sensing in geology and mineral resources is summarized from the aspects of hyperspectral data processing, information extraction, information analysis, prospecting and prediction.

Paper Details

Date Published: 12 March 2019
PDF: 12 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110232Y (12 March 2019); doi: 10.1117/12.2521828
Show Author Affiliations
Xinfeng Dong, China Aero Geophysical Survey & Remote Sensing Ctr. for Land and Resources (China)
Key Lab. of Aero Geophysics and Remote Sensing Geology (China)
Bokun Yan, China Aero Geophysical Survey & Remote Sensing Ctr. for Land and Resources (China)
Key Lab. of Aero Geophysics and Remote Sensing Geology (China)
Fuping Gan, China Aero Geophysical Survey & Remote Sensing Ctr. for Land and Resources (China)
Key Lab. of Aero Geophysics and Remote Sensing Geology (China)
Na Li, China Aero Geophysical Survey & Remote Sensing Ctr. for Land and Resources (China)
Key Lab. of Aero Geophysics and Remote Sensing Geology (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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