Share Email Print

Proceedings Paper

Novel wavelength measurement scheme using a stabilized interferometric system
Author(s): Wen-Jiang Shi; Yanong N. Ning; Kenneth T. V. Grattan; Andrew W. Palmer; Shanglian Huang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel interferometric detection scheme for measuring wavelength shift in an optical sensing system is described. In this scheme, in addition to the source wavelength to be measured, a further reference wavelength is employed to stabilize the optical path difference of the interferometer. This is designed to make the wavelength detection system insensitive to environment disturbances such as temperature fluctuation and mechanical vibration, and using this scheme a signal-to-noise ratio improvement of 25 db has been demonstrated.

Paper Details

Date Published: 24 September 1996
PDF: 4 pages
Proc. SPIE 2895, Fiber Optic Sensors V, (24 September 1996); doi: 10.1117/12.252139
Show Author Affiliations
Wen-Jiang Shi, City Univ. (United Kingdom)
Yanong N. Ning, City Univ. (United Kingdom)
Kenneth T. V. Grattan, City Univ. (United Kingdom)
Andrew W. Palmer, City Univ. (United Kingdom)
Shanglian Huang, Chongqing Univ. (China)

Published in SPIE Proceedings Vol. 2895:
Fiber Optic Sensors V
Kim D. Bennett; Byoung Yoon Kim; Yanbiao Liao, Editor(s)

© SPIE. Terms of Use
Back to Top