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MCP gain and its influence on ultraviolet photon counting imaging detectors
Author(s): Yong-an Liu; Neng Xu; Feng Shi; Zhe Liu; Xiao-feng Sai; Li-zhi Sheng; Jin-shou Tian; Bao-sheng Zhao
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Paper Abstract

Micro-channel Plates(MCPs) are an important part of ultraviolet photon counting imaging detectors. They can intensify single particles or photons by the multiplication of electrons via secondary emission.Thus, the MCP gain has an very important influence on the performance of ultraviolet photon counting imaging detectors. In this article, influence of MCP gain on decoding accuracy is studied by using Monte Carlo method. Simulation results show that decoding error is large when MCP gain is low,and MCPs shoud have at least 106 gain to ensure accurate decoding. At the same time, influence of MCP gain on decoding error was tested by using ultraviolet photon counting imaging system based on TWA(Tetra Wedge Anode,TWA). Experimental results are consistent with the theoretical analysis and simulation.

Paper Details

Date Published: 12 March 2019
PDF: 6 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102318 (12 March 2019); doi: 10.1117/12.2521274
Show Author Affiliations
Yong-an Liu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Neng Xu, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Zhe Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Xiao-feng Sai, Xi'an Institute of Optics and Precision Mechanics (China)
Li-zhi Sheng, Xi'an Institute of Optics and Precision Mechanics (China)
Jin-shou Tian, Xi'an Institute of Optics and Precision Mechanics (China)
Bao-sheng Zhao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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