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Research on single event upset effect of CMOS image sensor for space application
Author(s): Bo Wang; Li Xu; Ying Pan; Wei-xin Liu; Ze-bin Kong; Kun-shu Wang; Yu-dong Li; Wei-ming Zhu; Ming Xuan
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Paper Abstract

CMOS image sensor (CIS) is widely applied to remote sensing, spatial trend monitoring, spacecraft attitude control and aerospace engineering, which is across the key device of the platform technology of spacecraft and payload technology. However, Due to the complex radiation environment consist of Galactic cosmic rays, solar particles, and proton or electron from earth capture belts, CIS is inherently sensitive to single event effects, which is the bottleneck of space applications. In this study, 8T-global shutter CIS was taken as experimental sample. The test results show different function module of CIS occurred single event upset (SEU) leads to different abnormal image mode, such as the output image of "always zero", several adjacent column output anomalies, the whole image messy code. We will analyze microcosmic process of ionization charge generation, diffusion, collection, analyze macroscopic image anomaly, obtains the single event effect sensitive area of the device, deeply discusses the single event effect of CIS and its damage mechanism. The research results will enrich the 8T-global shutter CIS radiation effects theory, as well as there are provide scientific basis for anti-radiation design, test method and evaluation technology.

Paper Details

Date Published: 12 March 2019
PDF: 6 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102317 (12 March 2019); doi: 10.1117/12.2521237
Show Author Affiliations
Bo Wang, China Aerospace Science and Technology Corp. (China)
Li Xu, China Aerospace Science and Technology Corp. (China)
Ying Pan, China Aerospace Science and Technology Corp. (China)
Wei-xin Liu, China Aerospace Science and Technology Corp. (China)
Ze-bin Kong, China Aerospace Science and Technology Corp. (China)
Kun-shu Wang, China Aerospace Science and Technology Corp. (China)
Yu-dong Li, Xinjiang Technical Institute of Physics and Chemistry (China)
Wei-ming Zhu, China Aerospace Science and Technology Corp. (China)
Ming Xuan, China Aerospace Science and Technology Corp. (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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