Share Email Print
cover

Proceedings Paper • new

Advancements in Raman technology for identifying real-world samples
Author(s): Jun Zhao; Katherine A. Bakeev; Xin Jack Zhou
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Handheld Raman spectroscopy’s value for rapid field screening by safety and security personnel is well understood as evidenced by its implementation across the globe. Though Raman spectroscopy has the ability to nondestructively identify samples through transparent packaging, in real world scenarios challenging samples are frequently encountered. Raman screening must be effective for samples in a variety of packaging and for samples with coloration or impurities that give a high fluoresce that can overwhelm the Raman signal depending on the excitation laser wavelength. See through Raman technology has been developed to enable measurement through opaque packaging, sampling a larger area and with a deeper penetration depth of the Raman signal. Using a design of collinear sample illumination and Raman scattering collection at a higher efficiency, and spread over a larger sampling area, there is a lower power density of illumination on the sample, reducing issues of sample heating that can be problematic for dark samples. The measurement of a larger sample area provides more reliable identification of solids that are often inhomogeneous. This see through Raman technology and the use of a longer laser wavelength excitation overcomes many of the difficulties encountered in use of Raman spectroscopy for field testing.

Paper Details

Date Published: 13 May 2019
PDF: 8 pages
Proc. SPIE 10983, Next-Generation Spectroscopic Technologies XII, 109830L (13 May 2019); doi: 10.1117/12.2521151
Show Author Affiliations
Jun Zhao, B&W Tek (United States)
Katherine A. Bakeev, B&W Tek (United States)
Xin Jack Zhou, B&W Tek (United States)


Published in SPIE Proceedings Vol. 10983:
Next-Generation Spectroscopic Technologies XII
Richard A. Crocombe; Luisa T.M. Profeta; Abul K. Azad, Editor(s)

© SPIE. Terms of Use
Back to Top