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Proceedings Paper

Study of measurement approach for photodevice impedance
Author(s): Zhiyu Wang; Jin Wu
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Paper Abstract

It has presented a measurement approach for photo-devices impedance in this paper. We have designed and performed the special test fixture and standard for semiconductor laser diode chip impedance and achieved satisfying impedance calibration curves from 0.045 GHz to 5 GHz.

Paper Details

Date Published: 20 September 1996
PDF: 5 pages
Proc. SPIE 2893, Fiber Optic Components and Optical Communication, (20 September 1996); doi: 10.1117/12.252052
Show Author Affiliations
Zhiyu Wang, UEST of China (China)
Jin Wu, UEST of China (China)


Published in SPIE Proceedings Vol. 2893:
Fiber Optic Components and Optical Communication
Kam Tai Chan; Shuisheng Jian; Franklin F. Tong, Editor(s)

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