Share Email Print
cover

Proceedings Paper • new

Ameliorated method of intensity correlation imaging with coherent light illumination
Author(s): Chong Li; Xin Gao; Xi-yu Li; Chang-ming Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to study the influence of variation of the active laser coherence on the intensity correlation imaging, the coherence factor is introduced by the generalized Van Citter-Zernike theorem. Establishing the intensity correlation imaging model based on the variation of coherence, a laboratory experimental platform is designed. Hence, the effect of coherence on spectral modulus can be calculated by using the new model. Then, different phase retrieval algorithms are used to restore the images. The experimental results show that: coherence variation has an effect on the calculated spectral modulus, and the coherence factor can eliminate the effect to a certain extent. The intensity correlation imaging model based on coherence variation can better restore target images, which proved the correctness of the model. Image quality of prior information iteration algorithm is higher than that of hybrid input and output algorithm. The signal-to-noise ratio of reconstructed image is measured to up to be 5.3 dB.

Paper Details

Date Published: 12 March 2019
PDF: 6 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110230Q (12 March 2019); doi: 10.1117/12.2520349
Show Author Affiliations
Chong Li, Beijing Institute of Tracking and Telecommunication Technology (China)
Xin Gao, Beijing Institute of Tracking and Telecommunication Technology (China)
Xi-yu Li, Beijing Institute of Tracking and Telecommunication Technology (China)
Chang-ming Lu, Beijing Institute of Tracking and Telecommunication Technology (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

© SPIE. Terms of Use
Back to Top