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Optimizing microscan for radiometry with cooled IR cameras.
Author(s): Fabian Göttfert; Johannes Bohm; Konrad Heisig; Gunnar Dammass; Matthias Krauß
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Paper Abstract

Optical microscanning is a popular method in infrared imaging, providing a relatively cost-efficient means to increase the spatial resolution of the camera system. Here, we discuss the impact of microscan on parameters relevant for thermography applications. Other than imaging applications, thermography is extremely sensitive to changes of the absolute irradiation power caused by the additional microscan optics. Additional reflectance and stray radiation must be avoided or corrected for. Also, current and future developments in detector technology, such as reduced pixel pitch, will pose new challenges to the feasibility of microscan. As a practical example, we will present a microscan implementation adapted to the specific needs of thermography applications with infrared cameras based on a cooled detector. A fast rotating filter wheel with precisely adjusted deflection windows is used to produce the desired image shift. This allows us to utilize microscan while retaining the high imaging speeds usually required in applications employing cooled infrared detectors. Often, calibrated thermographic cameras are used in applications necessitating a wide range of calibrated temperature measuring ranges reaching from -40 °C to <2000 °C. Optimizing the design of the microscan device for compactness opens the possibility to combine the feature with additional optical filters, allowing wide temperature measurement ranges as well as imaging within different spectral windows.

Paper Details

Date Published: 14 May 2019
PDF: 8 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110010R (14 May 2019); doi: 10.1117/12.2519933
Show Author Affiliations
Fabian Göttfert, InfraTec GmbH (Germany)
Johannes Bohm, InfraTec GmbH (Germany)
Konrad Heisig, InfraTec GmbH (Germany)
Gunnar Dammass, InfraTec GmbH (Germany)
Matthias Krauß, InfraTec GmbH (Germany)


Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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