Share Email Print
cover

Proceedings Paper

Physical properties and optical recording performance of In47Sb14Te39 phase change thin films using 514.5-nm wavelength laser beam
Author(s): Liqiu Q. Men; Fusong S. Jiang; Chao Liu; Huiyong Liu; Fuxi Gan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Physical properties of In47Sb14Te39 thin films prepared by DC magnetron sputtering method are studied. X- ray diffraction and DSC results indicate that the crystallization compounds include mainly In3SbTe2 with small amounts of InTe, In2Te3. Optical recording test of the films state clearly that larger reflectivity contrast can be obtained at lower power Argon laser irradiation. The erasing contrast is comparatively lower but can be improved by multi-films match.

Paper Details

Date Published: 20 September 1996
PDF: 9 pages
Proc. SPIE 2890, Optical Recording, Storage, and Retrieval Systems, (20 September 1996); doi: 10.1117/12.251980
Show Author Affiliations
Liqiu Q. Men, Shanghai Institute of Optics and Fine Mechanics (China)
Fusong S. Jiang, Shanghai Institute of Optics and Fine Mechanics (China)
Chao Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Huiyong Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2890:
Optical Recording, Storage, and Retrieval Systems
Baogen Feng; Yoshito Tsunoda, Editor(s)

© SPIE. Terms of Use
Back to Top