Share Email Print
cover

Proceedings Paper • new

Algorithm for image stitching in the infrared
Author(s): Evgenii Semenishchev; Viacheslav Voronin; Aleksandr Zelensky; Igor Shraifel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper considers the question of stitching of infrared images obtained from different points and with the modified internal parameters of the camera. As test data, we use images taken by the thermal camera. To combine pairs of images, we use the several auxiliary algorithms are required, including: elimination of noise on images (denoising); restoration of sharpness on images (deblurring); search for basic elements on pairs IR images; separation of images into elements with given threshold values; search for correlations between base elements; elimination of false matches; search for the image conversion coefficient; search for the boundary of stitching and check the conditions for overlapping objects; if necessary, the perform the color correction operation and change the color balance; stitching pair of images and finding a common border. On the set of test images show the effectiveness of the proposed approach.

Paper Details

Date Published: 30 May 2019
PDF: 7 pages
Proc. SPIE 11002, Infrared Technology and Applications XLV, 110022H (30 May 2019); doi: 10.1117/12.2519537
Show Author Affiliations
Evgenii Semenishchev, Moscow State Univ. of Technology "Stankin" (Russian Federation)
Don State Technical Univ. (Russian Federation)
Viacheslav Voronin, Moscow State Univ. of Technology "Stankin" (Russian Federation)
Don State Technical Univ. (Russian Federation)
Aleksandr Zelensky, Moscow State Univ. of Technology (Russian Federation)
Igor Shraifel, Don State Technical Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11002:
Infrared Technology and Applications XLV
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson, Editor(s)

© SPIE. Terms of Use
Back to Top