Share Email Print
cover

Proceedings Paper • new

Mid-infrared OCT imaging in highly scattering samples using real-time upconversion of broadband supercontinuum covering from 3.6-4.6 μm
Author(s): Christian R. Petersen; Niels M. Israelsen; Ajanta Barh; Deepak Jain; Mikkel Jensen; Günther Hannesschläger; Peter Tidemand-Lichtenberg; Christian Pedersen; Adrian Podoleanu; Ole Bang
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a mid-infrared spectral-domain optical coherence tomography system operating at 4.1 μm central wavelength with a high axial resolution of 8.6 μm enabled by more than 1 μm bandwidth from 3.58-4.63 μm produced by a mid-infrared supercontinuum laser. The system produces 2D cross-sectional images in real-time enabled the high-brightness of the supercontinuum source in combination with broadband upconversion of the signal to the range 820-865 nm, where a standard 800 nm array spectrometer can be used for fast detection. We discuss the potential applications within nondestructive testing in highly scattering materials and within biomedical imaging for achieving the in-vivo optical biopsy.

Paper Details

Date Published: 4 March 2019
PDF: 6 pages
Proc. SPIE 10873, Optical Biopsy XVII: Toward Real-Time Spectroscopic Imaging and Diagnosis, 108730X (4 March 2019); doi: 10.1117/12.2519444
Show Author Affiliations
Christian R. Petersen, DTU Fotonik (Denmark)
NORBLIS IVS (Denmark)
Niels M. Israelsen, DTU Fotonik (Denmark)
NORBLIS IVS (Denmark)
Ajanta Barh, DTU Fotonik (Denmark)
Deepak Jain, DTU Fotonik (Denmark)
Mikkel Jensen, DTU Fotonik (Denmark)
Günther Hannesschläger, Research Ctr. for Non Destructive Testing GmbH (Austria)
Peter Tidemand-Lichtenberg, DTU Fotonik (Denmark)
NLIR ApS (Denmark)
Christian Pedersen, DTU Fotonik (Denmark)
NLIR ApS (Denmark)
Adrian Podoleanu, Univ. of Kent (United Kingdom)
Ole Bang, DTU Fotonik (Denmark)
NORBLIS IVS (Denmark)
NKT Photonics A/S (Denmark)


Published in SPIE Proceedings Vol. 10873:
Optical Biopsy XVII: Toward Real-Time Spectroscopic Imaging and Diagnosis
Robert R. Alfano; Stavros G. Demos; Angela B. Seddon, Editor(s)

© SPIE. Terms of Use
Back to Top