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Proceedings Paper

Compact erbium lasers in the IR photorefractive keratectomy (PRK)
Author(s): Baining Liu; Hans Joachim Eichler; O. Sperlich; A. Holschbach; M. Kayser
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Paper Abstract

Erbium lasers deliver laser radiation near 3 micrometers and are a promising alternative to excimer laser photorefractive keratectomy (UV-PRK). In addition to easier handling due to all solid state technology, especially when operated in the fundamental mode, IR-PRK eliminates the potential of mutagenic side effects associated with UV-PRK. However, a successful IR-PRK for the clinic treatment in the near future demands both technological development of erbium lasers in different operation modes and clinical investigation of interaction between 3 micrometers radiation and human corneas. The excellent cooperation between university, company and hospital makes this possible. Uncoated thin plates made from infrared materials were found to be effective etalon reflectors with high damage threshold as high as 1 GW/cm2 for erbium lasers. Four kinds of such reflectors were successfully tested in Q-switched Er:YAG-laser at 2.94 micrometers and Er:Cr:YSGG-laser at 2.80 micrometers. Very stable operation of our erbium lasers with high output energy both in free-running and Q-switched modes is realized. First infrared photorefractive keratectomy (IR-PRK) for myopic correction in human corneas by a free-running erbium laser based on our new construction concepts was achieved.

Paper Details

Date Published: 23 September 1996
PDF: 8 pages
Proc. SPIE 2887, Lasers in Medicine and Dentistry: Diagnostics and Treatment, (23 September 1996); doi: 10.1117/12.251930
Show Author Affiliations
Baining Liu, Technische Univ. Berlin (Germany)
Hans Joachim Eichler, Technische Univ. Berlin (Germany)
O. Sperlich, Technische Univ. Berlin (Germany)
A. Holschbach, Rudolf Virchow Memorial Hospital (Germany)
M. Kayser, Spektrum GmbH (Germany)


Published in SPIE Proceedings Vol. 2887:
Lasers in Medicine and Dentistry: Diagnostics and Treatment
Brij M. Khorana; Junheng Li; Michail M. Pankratov, Editor(s)

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