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Proceedings Paper

Cellular automata analysis of the structure of carrier lifetime and its multicausal nonlinear dependence in semiconductor lasers
Author(s): Marziale Milani; Fabio Previdi
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Paper Abstract

The dependence of spontaneous carrier lifetime (tau) s suggests new experiments for the determination of microscopic parameters of the active region material. Cavity geometry's are time evolving structures due to the high non- linearities typical of the elementary processes involved. A computational approach basically different from the differential equation one, is being developed. The results obtained by this approach are compared with the analytical and the experimental ones, thus leading to the possible characterization of devices just at the wafer level. Finally complementary information are extracted from relaxation oscillations.

Paper Details

Date Published: 24 September 1996
PDF: 12 pages
Proc. SPIE 2886, Semiconductor Lasers II, (24 September 1996); doi: 10.1117/12.251886
Show Author Affiliations
Marziale Milani, Univ. degli Studi di Milano (Italy)
Fabio Previdi, Univ. degli Studi di Milano (Italy)


Published in SPIE Proceedings Vol. 2886:
Semiconductor Lasers II
Siamak Forouhar; Qiming Wang, Editor(s)

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