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CMOS image sensor with off-center circular apertures for depth extraction
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Paper Abstract

A CMOS image sensor with off-center circular apertures for two-dimensional (2D) and three-dimensional (3D) imaging was fabricated, and its performance was evaluated, including the results of 2D and 3D images. The pixel size, based on a four-transistor active pixel sensor with a pinned photodiode, is 2.8 μm × 2.8 μm. Disparate images as well as focused images for depth calculation can be obtained using the designed pixel pattern. The pixel pattern is composed of one white subpixel with a left-offset circular aperture, a blue pixel, a red pixel, and another white subpixel with a right-offset circular aperture. The proposed technique was verified by simulation and measurement results using a point light source. In addition, the depth image was implemented by calculating the depth information from the 2D images.

Paper Details

Date Published: 13 May 2019
PDF: 6 pages
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 1098011 (13 May 2019); doi: 10.1117/12.2518802
Show Author Affiliations
Byoung-Soo Choi, Kyungpook National Univ. (Korea, Republic of)
Jimin Lee, Kyungpook National Univ. (Korea, Republic of)
Sang-Hwan Kim, Kyungpook National Univ. (Korea, Republic of)
Jewon Lee, Kyungpook National Univ. (Korea, Republic of)
Junwoo Lee, Kyungpook National Univ. (Korea, Republic of)
Seunghyuk Chang, Ctr. for Integrated Smart Sensors (Korea, Republic of)
JongHo Park, Ctr. for Integrated Smart Sensors (Korea, Republic of)
Sang-Jin Lee, Ctr. for Integrated Smart Sensors (Korea, Republic of)
Jang-Kyoo Shin, Kyungpook National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

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