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Mode-selective read-in integrated circuit with improved input range for infrared scene projectors
Author(s): Min Ji Cho; Hee Chul Lee
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Paper Abstract

As infrared (IR) imaging systems are being used more often in military fields, the importance of IR sensor evaluation system has emerged. Owing to their non-destructiveness and cost effectiveness, hardware-in-the-loop (HWIL) systems with IR scene projectors (IRSPs) are now being widely used. IRSPs generate virtual IR scenes to evaluate IR imaging systems, which has two performance parameters: thermal range and thermal resolution. Specifically, IR scene quality is determined by the thermal resolution performance and the input digital depth increment can provide a suitable solution to improve resolution. However, the input digital depth increment is limited by system noise and setting a sufficient thermal resolution with wide thermal range is difficult. In this paper, a mode-selective read-in integrated circuit (RIIC) with native transistor is proposed. The native transistor having almost zero threshold voltage, increases the input range, which helps to improve noise margin. A prototype of the RIIC was fabricated using a 0.18-μm 1-poly 6-metal CMOS process and its performance was estimated from measured data. Thermal resolution below 325 K was less than 30 mK and was 185 mK above 325 K in high-current mode; with 14-bit digital resolution, the thermal range varied from 270-325 K to 270-990 K.

Paper Details

Date Published: 14 May 2019
PDF: 8 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 1100119 (14 May 2019); doi: 10.1117/12.2518578
Show Author Affiliations
Min Ji Cho, KAIST (Korea, Republic of)
Hee Chul Lee, KAIST (Korea, Republic of)


Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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