Share Email Print
cover

Proceedings Paper • new

Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This research proposes a motion-induced error reduction method for phase shifting profilomtry. Particularly, each illuminated fringe pattern will be captured twice in one projection cycle when imaging a highly dynamic scene, resulting in two sets of phase shifted fringe images be obtained. A phase map will be computed for each phase shifting set in preparation for error analysis. Finally, motion-induced phase errors will be compensated by examining the difference of the two phase maps obtained respectively from two phase shifting sets. This method uses defocused 1-bit binary patterns to bypass rigid camera-projector synchronization, which has potential for high-speed applications.

Paper Details

Date Published: 13 May 2019
PDF: 6 pages
Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 1099108 (13 May 2019); doi: 10.1117/12.2518319
Show Author Affiliations
Vignesh Suresh, Iowa State Univ. of Science and Technology (United States)
Yajun Wang, Wuhan Univ. (China)
Beiwen Li, Iowa State Univ. of Science and Technology (United States)


Published in SPIE Proceedings Vol. 10991:
Dimensional Optical Metrology and Inspection for Practical Applications VIII
Kevin G. Harding; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top