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Image quality for an IRFPA: a system integrator point of view
Author(s): Vincent Guériaux; Eric Belhaire; Véronique Besnard
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Paper Abstract

This paper presents the image quality issues encountered at system level when working with infrared imagers. This work highlights some characteristics that are usually not specified for off-theshelf components. The first part of this work discusses the need for short-term and long-term stability. We present a comparative study of two sensors in the MW band based on the residual fixed pattern noise and defective pixels. In the second part we present the issues of patterns defects. We conduct an experimental study on twelve persons to estimate the perception threshold of such defects within an infrared sequence.

Paper Details

Date Published: 14 May 2019
PDF: 13 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110010D (14 May 2019); doi: 10.1117/12.2518244
Show Author Affiliations
Vincent Guériaux, Thales LAS France (France)
Eric Belhaire, Thales LAS France (France)
Véronique Besnard, Thales LAS France (France)


Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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