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Proceedings Paper • new

Measurement error of radiation gain of UV image intensifier
Author(s): Shuning Yang; Ze Yao; Wujun Huang; Wei Cheng; Yingping He; Xiaofeng Bai; Qingyun Meng
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Paper Abstract

The radiation gain of UV image intensifier is an important index to measure response capability of ultraviolet detector, thus its accurate measurement is necessary. This paper establishes radiation gain measurement method and device of ultraviolet image intensifier, The process of measuring the magnitude and Influencing factors for the measurement of ultraviolet radiation gain by the equipment were analyzed. And the error analysis of the measurement uncertainty of the device, The radiation gain measurement has an extended uncertainty of 9.59%, It can meet the requirements of high precision measurement of radiation gain of UV image intensifier. The research achievement can support the research and development of domestic ultraviolet detectors, thus providing an effective and accurate detection method for improving and promoting the technical performance of ultraviolet detectors.

Paper Details

Date Published: 12 March 2019
PDF: 5 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102306 (12 March 2019); doi: 10.1117/12.2516769
Show Author Affiliations
Shuning Yang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Ze Yao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Wujun Huang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Wei Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Yingping He, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Xiaofeng Bai, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Qingyun Meng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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