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Quantum-enhanced and quantum-inspired precision optical measurements (Conference Presentation)
Author(s): Jeff Lundeen
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Date Published: 5 March 2019
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Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342I (5 March 2019); doi: 10.1117/12.2515680
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Jeff Lundeen, Univ. of Ottawa (Canada)


Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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