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Spin noise spectroscopy in metastable helium at room temperature (Conference Presentation)
Author(s): Fabien Bretenaker; Pascal Neveu; Etienne Brion; Fabienne Goldfarb
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Paper Abstract

Noise is usually something that one would like to avoid when performing measurements. However, the information contained in fundamental noises might be of great interest for physicists. A recent example is the development of spin noise spectroscopy (SNS). In magnetic systems, the spectroscopy of the fundamental noise due to random spin fluctuations can be optically performed, by measuring the associated fluctuations of the Faraday rotation experienced by a linearly polarized probe beam, which propagates through the sample in the presence of a dc magnetic field [1]. Although a first experimental effort was initially reported in the early 1980s [2], only recently this method has seen a renewed interest due to advances in narrow line-width lasers and development in low noise electronics required for spectrum analysis [3]: it is now used to probe different properties of various media such as thermal atomic vapors, semi-conductors or quantum wells or defects in diamond [4]. In this talk, we will report our efforts to use this technique to probe the transitions of metastable helium and to understand the differences between the SNS spectra obtained along the different transitions. [1] V. S. Zapasskii, Adv. Opt. and Phot. 5 131 (2013) [2] E. B. Aleksandrov and V. S. Zapasskil, JETP 54 64 (1981) [3] S. A. Crooker, D. G. Rickel, A. V. Balatsky, and D. L. Smith, Nature 431 49 (2004) [4] N. A. Sinitsyn and Y. V. Pershin, Rep. on Prog. in Phys. 79 , 106501 (2016)

Paper Details

Date Published: 5 March 2019
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Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340Z (5 March 2019); doi: 10.1117/12.2515604
Show Author Affiliations
Fabien Bretenaker, Lab. Aimé Cotton (France)
Raman Research Institute (India)
Pascal Neveu, Lab. Aimé Cotton (France)
Etienne Brion, Lab. Aimé Cotton (France)
Fabienne Goldfarb, Lab. Aimé Cotton (France)


Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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