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Investigation of correcting errors in holographic data storage by light propagation analysis (Conference Presentation)
Author(s): Satoshi Tagami; Daisuke Barada; Toyohiko Yatagai

Paper Abstract

Recently, technology for high resolution device has improved. Accordingly, it is predicted that the demand is increasing. The device such as high-resolution display with amount of data requires large capacity data storage to store the data. Therefore, we considered that holographic data storage that is expected as large capacity can be used as storage device of UHD. However, many errors generate by noises in high density holographic data storage. It is supposed errors can be corrected by clarifying the cause of noises. In order to analyze the noises and correct the errors, light propagation analysis is required. Although several light propagation analysis methods are established, these are not suitable for analyzing holographic data storage. One of the reasons why not suitable is that heavy computation loads can be time-consuming in conventional methods because the thickness of volume holograms are much thicker than the wavelength of propagating light. In this study, we propose light propagation analysis method based on analytic function. In addition, we investigate method that can calculate light propagation in holographic data storage using the method. In holographic data storage, the information is recorded as electric susceptibility distribution of recording medium. This study introduces a parameter related light intensity and sensitive of medium and the Maxwell’s wave equation is expanded by Born-expansion using the parameter. Then, solutions of the wave equation can be solved analytically. Therefore, behavior of light wave in volume hologram can be expressed. We analyze the noises and investigate methods correcting errors by using this method.

Paper Details

Date Published: 4 March 2019
PDF
Proc. SPIE 10943, Ultra-High-Definition Imaging Systems II, 109430I (4 March 2019); doi: 10.1117/12.2514939
Show Author Affiliations
Satoshi Tagami, Utsunomiya Univ. (Japan)
Daisuke Barada, Utsunomiya Univ. (Japan)
Toyohiko Yatagai, Utsunomiya Univ. (Japan)


Published in SPIE Proceedings Vol. 10943:
Ultra-High-Definition Imaging Systems II
Seizo Miyata; Toyohiko Yatagai; Yasuhiro Koike, Editor(s)

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