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Integrated confocal imaging system
Author(s): Stefan Richter; Carsten Wehe; Uwe Wolf; Thomas Nobis; Lars-Christian Wittig; Philipp Huebner; Alexander Froeber; Gerhard Krampert; Dirk Thiele; Joerg Muetze; Michael Kempe
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Paper Abstract

We report on a concept of a benchtop microscope for routine applications. This concept system transfers key features of a high-end laser scanning microscope to a dedicated confocal fluorescence imaging system with appropriate footprint and reduced systems complexity. The optical beam path is specifically designed for the purposes of confocal imaging leading to a short beam path length that fulfills the footprint requirements. The system allows an optical 3D scanning through the sample of up to 100 depths of focus without moving the sample. The scanning unit consists of a 2D MEMS scanning mirror spanning and a deformable mirror forming 3 virtual scanning axes. For a compact integration of the detection beam path, a confocal detector with an actuated MEMS pinhole was developed to adjust the optical sectioning. The selected light sources are directly modulated lasers operating at wavelengths that are frequently used for fluorescence imaging in life science applications. To provide a simple interface to almost any user’s hardware such as laptops or tablets, the systems architecture for real time control and data acquisition is based on a FPGA.

Paper Details

Date Published: 4 March 2019
PDF: 10 pages
Proc. SPIE 10931, MOEMS and Miniaturized Systems XVIII, 109310K (4 March 2019); doi: 10.1117/12.2514552
Show Author Affiliations
Stefan Richter, Carl Zeiss AG (Germany)
Carsten Wehe, Carl Zeiss AG (Germany)
Uwe Wolf, Carl Zeiss AG (Germany)
Thomas Nobis, Carl Zeiss AG (Germany)
Lars-Christian Wittig, Carl Zeiss AG (Germany)
Philipp Huebner, Carl Zeiss AG (Germany)
Alexander Froeber, Carl Zeiss AG (Germany)
Gerhard Krampert, Carl Zeiss AG (Germany)
Dirk Thiele, Carl Zeiss AG (Germany)
Joerg Muetze, Carl Zeiss AG (Germany)
Michael Kempe, Carl Zeiss AG (Germany)


Published in SPIE Proceedings Vol. 10931:
MOEMS and Miniaturized Systems XVIII
Wibool Piyawattanametha; Yong-Hwa Park; Hans Zappe, Editor(s)

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