Share Email Print
cover

Proceedings Paper • new

Quantum image scanning microscopy: concept and considerations towards applicability
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Technological advancements in the creation, manipulation and detection of quantum states of light have motivated the application of such states to overcome classical limits in sensing and imaging. In particular, there has been a surge of recent interest in super-resolution imaging based on principles of quantum optics. However, the application of such schemes for practical imaging of biological samples is demanding in terms of signal-to-noise ratio, speed of acquisition and robustness with respect to sample labeling. Here, we re-introduce the concept of quantum image scanning microscopy (Q-ISM), a super-resolution method that enhances the classical image scanning microscopy (ISM) method by measuring photon correlations. Q-ISM was already utilized to achieve super-resolved images of a biological sample labeled with fluorescent nanoscrystals whose contrast is based entirely on a quantum optical phenomenon, photon antibunching. We present here an experimental demonstration of the method and discuss with further details its prospects for application in life science microscopy.

Paper Details

Date Published: 1 March 2019
PDF: 8 pages
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341P (1 March 2019); doi: 10.1117/12.2514459
Show Author Affiliations
Ron Tenne, Weizmann Institute of Science (Israel)
Uri Rossman, Weizmann Institute of Science (Israel)
Batel Rephael, Weizmann Institute of Science (Israel)
Yonatan Israel, Weizmann Institute of Science (Israel)
Stanford Univ. (United States)
Alexander Krupinski-Ptaszek, Univ. of Warsaw (Poland)
Radek Lapkiewicz, Univ. of Warsaw (Poland)
Yaron Silberberg, Weizmann Institute of Science (Israel)
Dan Oron, Weizmann Institute of Science (Israel)


Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)

© SPIE. Terms of Use
Back to Top