Share Email Print

Proceedings Paper • new

Direct observations of compositional changes of sub-20-nm Er-doped phase-separated nanoparticles in optical fibers (Conference Presentation)
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The study of amorphous phase-separated Dielectric Nano-Particles (DNPs) smaller than 10 nm is a great challenge for the materials community. In conjunction with Transmission Electron Microscopy (TEM) and Electron-Probe Micro-Analysis (EPMA), we took advantage of a recent technology, Tri-Dimensional (3D) Atom Probe Tomography (APT) to investigate the variations of the chemical composition in sub-20-nm oxide nanoparticles, grown in silicate glass through heat treatments, at their early stages of nucleation. More precisely, we are investigating the core of an optical fiber drawn from a preform prepared according to the Modified Chemical Vapor Deposition (MCVD) process. We provide here a comprehensive set of experimental data obtained from direct measurements of the concentration for P, Mg, Ge and Er within amorphous dielectric nanoparticles (DNP) of radii ranging from 1 nm to 10 nm. We report on an increase of the concentration of Mg and P with the size of the DNPs. Most importantly, we also demonstrate that erbium ions are partitioned in these small DNPs and their environment changes with the size of the nanoparticles. Molecular dynamics simulations were also implemented to discuss the structural modifications of the Er environment. This presentation highlights the trade off on the size of the DNPs: smaller to reduce light scattering vs bigger to modify luminescence properties.

Paper Details

Date Published: 5 March 2019
Proc. SPIE 10914, Optical Components and Materials XVI, 109140Q (5 March 2019); doi: 10.1117/12.2514239
Show Author Affiliations
Wilfried Blanc, Institut de Physique de Nice (France)
Isabelle Martin, Ametek (United States)
Hugues François Saint-Cyr, Ametek (United States)
Xavier Bidault, Lab. Photonique d'Angers (France)
Stéphane Chaussedent, Lab. Photonique d'Angers (France)
Chrystel Hombourger, CAMECA SAS (France)
Philippe Le Coustumer, Bordeaux Imaging Ctr. (France)
Sabrina Lacomme, Bordeaux Imaging Ctr. (France)
Daniel R. Neuville, Institut de Physique du Globe de Paris (France)
David J. Larson, Ametek (United States)
Ty J. Prosa, Ametek (United States)
Christelle Guillermier, Zeiss (United States)

Published in SPIE Proceedings Vol. 10914:
Optical Components and Materials XVI
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

© SPIE. Terms of Use
Back to Top