Share Email Print
cover

Proceedings Paper • new

Multi-frequency excitation based full-field laser scanning for improved depth estimation (Conference Presentation)
Author(s): Seong Jin Im; JunYoung Jeon; Gyuhae Park; To Kang; Soon Woo Han
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents the improved thickness estimation technique using Steady-state excitation Continuous-scanning Laser Doppler Vibrometery(SCLDV). In this study, the wavenumber sensitivity with respect to the thickness variations of a structure, along with the information of wave modes, is utilized to find an optimal interrogation frequency band for SCLDV. In addition, the use of multi-frequency steady-state response is used to improve the accuracy of the thickness variation. By utilizing the wavenumber sensitivity along with the multi-frequency excitations, the proposed SCLDV shows the improved depth estimation, compared to the previous approaches which empirically select the interrogation frequency. For validation of this technique, several experiments were performed on steel plates, which contain corrosion damage with various depth variations. The results showed that the proposed technique is very efficient in detecting and visualizing very small thickness variations of a structure at high speed.

Paper Details

Date Published: 1 April 2019
PDF
Proc. SPIE 10971, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIII, 109710B (1 April 2019); doi: 10.1117/12.2514225
Show Author Affiliations
Seong Jin Im, Chonnam National Univ. (Korea, Republic of)
JunYoung Jeon, Chonnam National Univ. (Korea, Republic of)
Gyuhae Park, Chonnam National Univ. (Korea, Republic of)
To Kang, Korea Atomic Energy Research Institute (Korea, Republic of)
Soon Woo Han, Korea Atomic Energy Research Institute (Korea, Republic of)


Published in SPIE Proceedings Vol. 10971:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIII
Andrew L. Gyekenyesi, Editor(s)

© SPIE. Terms of Use
Back to Top