Share Email Print
cover

Proceedings Paper • new

Thin film formation of cellulose nanofiber and its physical properties
Author(s): Lindong Zhai; Hyun Chan Kim; Jung Ho Park; Qin Yu Zhu; Jaehwan Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Cellulose nanofiber (CNF) is known to have high mechanical strength, high Young’s modulus, optical transparency, low thermal expansion coefficient and low density, which are beneficial for flexible display substrates and optical films. The purposes of this study is to fabricate ultrathin CNF film and to explore its physical properties. CNF suspension is extracted by 2,2,6,6-tetramethylpiperidin-1-oxyl (TEMPO) oxidation combined with aqueous counter collision (ACC) treatment from bleached hardwood pulp. The CNF suspension is cast on a thin positive photoresist (PR) layer by a doctor blade casting method followed by removing PR layer and drying on a polytetrafluoroethylene (PTFE) sheet to obtain ultrathin CNF film. Morphology of ultrathin CNF film is characterized by atomic force microscopy and the thickness of the film was characterized by FE-SEM. Transparency and birefringence of the prepared ultrathin CNF film are tested by using an UV-visible spectrometer and a digital camera. The piezoelectric response microscopy (PFM) is utilized to analysis the piezoelectric properties of ultrathin CNF film.

Paper Details

Date Published: 27 March 2019
PDF: 4 pages
Proc. SPIE 10969, Nano-, Bio-, Info-Tech Sensors and 3D Systems III, 109690X (27 March 2019); doi: 10.1117/12.2513872
Show Author Affiliations
Lindong Zhai, Inha Univ. (Korea, Republic of)
Hyun Chan Kim, Inha Univ. (Korea, Republic of)
Jung Ho Park, Inha Univ. (Korea, Republic of)
Qin Yu Zhu, Inha Univ. (Korea, Republic of)
Jaehwan Kim, Inha Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 10969:
Nano-, Bio-, Info-Tech Sensors and 3D Systems III
Jaehwan Kim, Editor(s)

© SPIE. Terms of Use
Back to Top