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CMC based on unitary linear regression equation
Author(s): Jingjing Li; Xiaoding Huang; Beichen Guo; Huan Zhang; Beibei Hu
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Paper Abstract

Calibration and measurement capability (CMC) that can provide calibration and measurement capability to the user in the normal conditions. CMC has a variety of expressions. Regression analysis is a statistical technique for studying correlation between key quality characteristics and the cause variables. After independently collecting n groups of experimental data(xi, yi), i=1,2,…,n., we can measure the relevancy between the two variables with the correlation coefficient. According to the stipulations of digital multimeter’s calibration method in JJF1587-2016"Calibration Specification for Multimeters", we can analyse the sources of the measurement uncertainties mainly includes the following aspects. (1)Uncertainties of the measurements introduced by the standard instruments.(2)Uncertainties of the measurements introduced by the measuring instrument’s resolution.(3)Uncertainties of the measurements introduced by the measure repeatability. The components of the above uncertainties over analyzed and an expression method of CMC based on unitary linear regression equation has given.

Paper Details

Date Published: 7 March 2019
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110534I (7 March 2019); doi: 10.1117/12.2513429
Show Author Affiliations
Jingjing Li, Beijing Oriental Metrology and Testing Institute (China)
Xiaoding Huang, Beijing Oriental Metrology and Testing Institute (China)
Beichen Guo, Beijing Oriental Metrology and Testing Institute (China)
Huan Zhang, Beijing Oriental Metrology and Testing Institute (China)
Beibei Hu, Beijing Oriental Metrology and Testing Institute (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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