Share Email Print
cover

Proceedings Paper • new

Choosing parameters of active reference mark optical-electronic systems spatial position control
Author(s): Ivan S. Nekrylov; Maksim A. Kleshchenok; Anastasia A. Blokhina; Elena A. Sycheva; Igor A. Konyakhin; Sergey V. Mednikov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Subject of the research. Parameters relations in active reference mark optical-electronic system spatial position control in presence of vertical temperature gradient is considered. The operation principle of the dispersion method of the vertical temperature gradient determination using colour camera and RGB optical radiation source is described. The basic condition for choosing parameters of active reference mark optical-electronic system is derived from relations that define hardware realization of the system and parameters of the air tract which are used in the dispersion method. Method. The principle of equal influence of error components on the total error is used. There is an assumption that there are no fluctuations of the air tract refractive index in time and space. Main results. The basic condition for choosing parameters of active reference mark optical-electronic system for spatial position control in presence of vertical temperature gradient is proposed. The efficiency of the dispersion method vertical temperature gradient influence minimization is proved. The basic condition proposed condition allows to estimate this efficiency and choose the hardware parameters. Practical significance. The results given in the paper can be used in design of active reference mark optical-electronic systems where the influence of the air tract is strong.

Paper Details

Date Published: 7 March 2019
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110534H (7 March 2019); doi: 10.1117/12.2513426
Show Author Affiliations
Ivan S. Nekrylov, ITMO Univ. (Russian Federation)
Maksim A. Kleshchenok, ITMO Univ. (Russian Federation)
Anastasia A. Blokhina, ITMO Univ. (Russian Federation)
Elena A. Sycheva, ITMO Univ. (Russian Federation)
Igor A. Konyakhin, ITMO Univ. (Russian Federation)
Sergey V. Mednikov, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

© SPIE. Terms of Use
Back to Top