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A test method of CMOS image sensors in dark field based on the genetic algorithm
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Paper Abstract

A new kind of CMOS image sensor test method, which is different from test standards EMVA1288 and ESCC 25000, is proposed in this paper based on photo transfer theory by using the rough adaptive genetic algorithm (RAGA). This test method can measure both system gain and dark signal together by utilizing dark field grey value only in dark field. In this way the complexity of test is reduced, and high and low temperature tests and dynamic burn-in test become easy to be carried out. Without light field exposure, the stability and reliability of dark signal testing are improved in certain extent. The experiment result shows that, this new test method is available and dependable. It reduces the complexity of test equipment and environment, simplifies test flow, shortens test duration, and decreases test cost.

Paper Details

Date Published: 8 February 2019
PDF: 9 pages
Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108431S (8 February 2019); doi: 10.1117/12.2512317
Show Author Affiliations
Shan Cong, Chine Aerospace Components Engineering Ctr. (China)
Dayu Zhang, Chine Aerospace Components Engineering Ctr. (China)
Mingchao Chang, Chine Aerospace Components Engineering Ctr. (China)
Qiang Wen, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 10843:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging
Yadong Jiang; Xiaoliang Ma; Xiong Li; Mingbo Pu; Xue Feng; Bernard Kippelen, Editor(s)

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