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Wavelength calibration system for diode laser
Author(s): Xiang Cheng; Xiaojun Liu; Changchun Chai; Hongzhou Yan; Jian Luo; Hong Zhu; He Zhou
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Paper Abstract

Currently the diode laser is widely used in the field of optoelectronics, especially in precise measurement based on laser-interferometry. Laser wavelength stability is a property that critical to the measurement. Since the laser wavelength is easy to be influenced by the environment and drive current, real-time monitoring and calibration of diode laser wavelength is extraordinary important for interferometry. In this paper, a real-time wavelength monitoring and calibration system for diode laser based interference measurement were developed. The experiment system was built and conducted to verify the feasibility of the system.

Paper Details

Date Published: 7 March 2019
PDF: 8 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110533Q (7 March 2019); doi: 10.1117/12.2512198
Show Author Affiliations
Xiang Cheng, Huazhong Univ. of Science and Technology (China)
Xiaojun Liu, Huazhong Univ. of Science and Technology (China)
Changchun Chai, Huazhong Univ. of Science and Technology (China)
Hongzhou Yan, Huazhong Univ. of Science and Technology (China)
Jian Luo, Huazhong Univ. of Science and Technology (China)
Hong Zhu, Huazhong Univ. of Science and Technology (China)
He Zhou, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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