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Lensless in-line holographic microscope resolution enhancement method from two intensity measurements based on data interpolation
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Paper Abstract

With the improvement of the performance of electro-optical sensors and computer performance, lensless digital in-line holography has been studied and applied widely. However, the resolution of the digital in-line holography system are limited by pixel size and influenced by the twin image. To solve the problem, we proposed a resolution enhancement method, which collects two holograms with different sample-to-sensor distance. The reconstruction is based on Gerchberg–Saxton iteration algorithm, using two normalized and interpolated holograms. We used two prior constraints in the iteration process according to the iteration algorithm for phase retrieval: intensity of the two normalized holograms and the non-negative absorption of the sample. In this method, the interpolation operation before phase retrieval can digitally reduce the sampling interval, and the interpolation point will be optimized with the iteration process. We simulated the resolution enhancement method, and the results of the simulation show that the resolution and image quality of lensless digital in-line holography can be effectively improved.

Paper Details

Date Published: 30 January 2019
PDF: 5 pages
Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 108410F (30 January 2019); doi: 10.1117/12.2512106
Show Author Affiliations
Fanxing Li, Univ. of Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Peng Tian, Univ. of Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Wei Yan, Univ. of Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Fan Yang, Univ. of Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Fuping Peng, Univ. of Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 10841:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics
Mingbo Pu; Xiaoliang Ma; Xiong Li; Minghui Hong; Changtao Wang; Xiangang Luo, Editor(s)

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