Share Email Print

Proceedings Paper • new

Multi-structure elements morpholoy for improved anti-noise edge detection
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High precision occupies an extremely important position in the field of mechanical processing and laser measurement. Under these high precision requirements, image processing is widely applied and is especially demanding. As the essential pre-processing step in the process of image processing, the quality of image edge extraction directly affects the processing precision of the whole image, and then affects the final measurement or machining precision. The traditional edge detection method has the defects of no noise immunity, and cannot achieve high-activity processing of sophisticated image edge problems. Through the in-depth research and analysis of various knowledges concerning edge extraction, a novel anti-noise edge detector based on multi-structure elements morphology of different directions for binary, gray scale and color images is proposed in this paper. We get the final edge information by using eight morphological operations respectively and synthetic weighted method. It can remove the noise effectively while detecting complete edge information. Experimental results show that, comparing with conventional edge detection operations, the proposed method attains the outcome of eliminating the image noise and maintaining good edge effectively for simulated image.

Paper Details

Date Published: 7 March 2019
PDF: 9 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110532Q (7 March 2019); doi: 10.1117/12.2512022
Show Author Affiliations
Yarui Ma, Harbin Institute of Technology (China)
Jiwen Cui, Harbin Institute of Technology (China)
Houhu Lai, Harbin Institute of Technology (China)
Hui Wang, Harbin Institute of Technology (China)
Jiubin Tan, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

© SPIE. Terms of Use
Back to Top