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Angle measurement for cross-line target image based on fourier-polar transform algorithm
Author(s): Fuzhong Bai; Jun Kong; Tieying Zhang; Yongxiang Xu; Xingrong Shi
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Paper Abstract

In visual detection fields based on line-structured light, the analysis of optical stripe image is a key problem. For the cross-line target image, through measuring the angle between two linear optical stripes the target position or some system’s parameters can be obtained. The traditional technique usually needs many preprocessing steps including image filtering, threshold segmentation, thinning processing and so on. For the images with low signal noise ratio or non-uniform intensity distribution, their application performance will be challenged. Based on the characteristic of translation invariance and rotation synchronization of two-dimensional Fourier transform, the paper combines Fourier transform with polar transform to form new Fourier-polar transform algorithm. It implements the angle measurement in the frequency-domain replaced in the spatial domain. At the same time, to improve the convenient of compute, the polar transform is adopted to calculate the distribution direction of amplitude spectrum energy. The proposed Fourier-polar transform algorithm uses the overall information of the image, and the calculating process is simple and no requirement of image preprocessing. Therefore, it can be applied to measure the angle of cross-line target image in low quality image such as low signal-to-noise ratio or with noise.

Paper Details

Date Published: 7 March 2019
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110532D (7 March 2019); doi: 10.1117/12.2511908
Show Author Affiliations
Fuzhong Bai, Inner Mongolia Univ. of Technology (China)
Jun Kong, Inner Mongolia Univ. of Technology (China)
Tieying Zhang, Chifeng Product Quality and Measurement Inspect Institute (China)
Yongxiang Xu, Inner Mongolia Univ. of Technology (China)
Xingrong Shi, Beijing Xicheng College of Economic Science (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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